IC testing
Service Scope
Covering mainstream digital, analog, digital-analog hybrid and other chip types.
Service Standards
● CP test hardware design
The test hardware is a pin card, it is used for physical connection between ATE and DIE.
● FT test hardware design
The test hardware is loadboard+socket+changekit, which is used to test the physical connection between the equipment and the packaged chip.
● Board-level verification
To build a "simulated" chip working environment, test the chip function or check whether the chip can work normally in various harsh environments.
● SLT testing
A test function in the system environment to detect the quality, and a supplementary means of FT, mainly for SOC devices.
Our Service
The Integrated Circuit Testing and Analysis Division is a leading domestic semiconductor quality evaluation and reliability improvement program technical service provider, has invested more than 300 high-end testing and analysis equipment, formed a talent team with doctors and experts as the core, and created 8 special experiments. It provides professional failure analysis and wafer-level manufacturing for enterprises in the fields of equipment manufacturing, automobiles, power electronics and new energy, 5G communications, optoelectronic devices and sensors, rail transit and materials, and fabs. Process analysis, component screening, reliability testing, process quality evaluation, product certification, life evaluation and other services help companies improve the quality and reliability of electronic products.
What are your prices?
Our prices are subject to change depending on supply and other market factors. We will send you an updated price list after your company contact us for further information.
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